In a classified facility, the contamination event that matters is the one you cannot trace.

Defense manufacturing combines the most stringent contamination requirements of any sector with the most restrictive data security constraints. Guidance systems, electro-optical sensors, precision munitions, and military avionics are assembled in facilities where network connectivity is restricted or prohibited and where the product specifications leave no margin for contamination compromise. The contamination control program must be continuous and complete — and the data it generates must stay inside the facility’s security perimeter.

APMON Defense was designed for this environment. It delivers full ISO 14644-17 measurement capability — real-time particle deposition rate at the product surface, every four minutes, throughout assembly — within a local data architecture that requires no external network dependency. All measurement data is processed and stored on-site. The instrument provides the same measurement fidelity as APMON Connect, without the security implications of wifi connectivity. For programs where data sovereignty is a requirement rather than a preference, there is no alternative that delivers this combination of measurement standard and architectural security.

Surface cleanliness monitoring with SUMON completes the picture. Optical components in electro-optical systems, connector interfaces in guidance electronics, and structural bonding surfaces in airframe assemblies all require surface cleanliness verification before integration. SUMON measures particle fall-out on these surfaces non-contactly in ten seconds — within the facility, with no data leaving the site, with results that can be expressed in the IEST-STD-CC1246E cleanliness codes referenced across defense supply chains for precision component surface cleanliness specification.